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Laser-Laboratorium Göttingen e.V.

Laser-Laboratorium Göttingen e.V.

Focused ion beam-scanning electron microscopy: Imaging the third dimension in cells and tissue

PhD Wiebke Möbius MPI Institute of Experimental Medicine Department of Neurogenetics
Vortragsankündigung - Donnerstag 29. September 2016

Termin: 18. Oktober 2016 um 17:15
Ort: Seminarraum Laser-Laboratorium Göttingen e.V., Hans-Adolf-Krebs-Weg 1, 37077 Göttingen

The application of scanning electron microscopy (SEM) goes far beyond the well-known surface imaging using secondary electrons. Backscattered electrons from the surface of conventional plastic-embedded biological EM-samples create EM-images which resemble the typical transmission electron microscopy (TEM) picture. In contrast to the TEM, thin sections of the sample are not required. This means that thick sections as well as whole specimens can be imaged in the SEM. A SEM equipped with a focused ion beam (FIB) can be used for imaging in combination with a fine slicing tool within the microscope: This makes it possible to perform high resolution volume electron microscopy by removing thin layers of the sample and viewing the freshly exposed block face repeatedly and in an automated fashion (serial block face imaging). After purchasing such an instrument with the support from the CNMPB and the establishment of protocols we are now able to create image stacks from tissue of different species to address questions which require 3D analysis. Moreover, the instrument is able to generate large images from sections mounted on wafer in an automated fashion covering areas such as a complete nerve. This Microscopy Club is an opportunity to give an update on the progress we made with the instrument and discuss the results which can be obtained.

 





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